Item | Typical Model | Typical Size (mm) | Product Features |
---|---|---|---|
YS-1220 |
Fused Silica |
Φ150x100 |
Synthetic fused silica and quartz ingot for Semiconductor, based on a variety of synthetic quartz prepara- tion processes, has excellent different and stable physical and chemical properties: · ppb level impurity content · Controllable hydroxyl content (0.5-1000ppm)
It can fully meet the application needs of various processes in semiconductor, display panel and photovoltaic production |
Φ300x50 |
|||
400x400x50 |
|||
YS-2230/YS-1230 |
500x500x60 |
||
YS-1240 |
Φ1000x30 |
||
YW-1804/1806/1808/1812 |
Fused Silica / Quartz Wafer |
Φ150 ~ 300 Min Thickness:0.05 |
|
YSM-6025/YSM-6025R |
Photomask Substrate |
152.4x152.4x6.35 |
|
YR-1220 / YR-1230 / YR-1240 |
Fused Silica Rod |
Φ2 ~ 200 Max Length:3000 |
|
YT-2220 / YT-2230 |
Fused Silica Tube |
OD:15 ~ 450 WT:1.0 ~ 30 Max Length:2000 |
Typical lmpurities Content①(ppm)
Item |
Li |
Na |
K |
Mg |
Ca |
Cu |
Al |
Cr |
Fe |
Ti |
OH |
---|---|---|---|---|---|---|---|---|---|---|---|
YS-1320 / YS-1220 |
≤0.001 |
≤0.003 |
≤0.001 |
≤0.001 |
≤0.001 |
≤0.001 |
≤0.003 |
≤0.001 |
≤0.001 |
≤0.005 |
<1 |
YS-2330 / YS-2230 |
≤0.001 |
≤0.005 |
≤0.005 |
≤0.005 |
≤0.005 |
≤0.001 |
≤0.005 |
≤0.001 |
≤0.001 |
≤0.008 |
<250 |
①Test Method: ICP-MS